AS191: Automated Selected Ion Flow Tube Mass Spectrometry (SIFT-MS)

Martin Perkins

6th June 2018

Automated Selected Ion Flow Tube Mass Spectrometry (SIFT-MS):

Traditionally, analysis with SIFT-MS has relied on either passive ambient monitoring or manual introduction of large volume gas and headspace samples, for example canister or Tedlar bag sampling.

Whilst this is an effective means of analysis, it is labour intensive and can be logistically problematic.

In this application note, we demonstrate a fully automated SIFT-MS system coupled to GERSTEL’s MultiPurpose Sampler, with a range of initial applications showing the utility of this automated approach.

This development of a truly automated SIFT-MS system has the potential to simplify sampling and increases the applicability of SIFT-MS for a large number of lab based applications.



Element Application Notes:

Element (and our partners) regularly produce Application Notes. These cover a wide and diverse range of methods, techniques, applications, and related chromatography technology. Our Application Notes provide detailed technical information, unique applications insight and method development & validation, as well as systems configuration innovations to ensure readers can further their knowledge in an engaging way. For many years, Element’s Application Notes have helped and supported analytical chemists in the fields of Gas Chromatography – GC, Liquid Chromatography – LC, and Mass Spectrometry – MS achieve to develop analytical solutions. Visit our Applications Note page to search for the insight you need in the following categories: Matrix, Technique, Analyte, Instruments, Product, Industry. Or alternatively, CONTACT US for more information or to put forward an Application Note subject and our Applications Team will be happy to support you in any way they can.



Before you download...

Please enter your email address before downloading this document.