AS236: Automated SIFT-MS – Static Headspace Analysis

Martin Perkins

27th May 2020

In this application note, we discuss the basics of static headspace analysis, as applied to SIFT-MS and cover all the significant parameters that may affect results.

Automated SIFT-MS is a highly effective way of analysing a wide range of volatile organic compounds, from formaldehyde to sesquiterpenes and siloxanes, that can be found in a variety of different matrices including water, soil, pharmaceuticals and polymers.

Efficient, high throughput methods can be run using the combination of GERSTEL’s MPS Robotic autosamplers and Syft Technologies’ SIFT-MS.

To enable current, new and prospective users to benefit from the knowledge gathered at Element, a series of six webinars were run in March and April covering all aspects of Automated SIFT-MS.

This will give the reader a good starting point to further develop methods applicable to their analysis.


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